hot holes造句

• Hot hole injection experiments reveal that the lifetime of ultra - thin gate oxide is not simply determined by the total number of injected hole
  热空穴注入的实验结果表明超薄栅氧化层的击穿不仅由注入的空穴数量决定。
• Secondly , the transient characteristics of fn tunneling and hot hole ( hh ) stress induced leakage current ( silc ) in ultra - thin gate oxide are investigated respectively in this dissertation
  其次，本文分别研究了fn隧穿应力和热空穴( hh )应力导致的超薄栅氧化层漏电流瞬态特性。
• The author ' s main contributions are outlined as following : first , the roles of hot electron and hole in dielectric breakdown of ultra - thin gate oxides have been quantitatively investigated by separately controlling the amounts of hot electron and hot hole injection using substrate hot hole ( shh ) injection method . the changes of threshold voltage have been discussed under different stress conditions
  主要研究结果如下：首先，利用衬底热空穴( shh )注入技术分别控制注入到超薄栅氧化层中的热电子和空穴的数量，定量研究了热电子和空穴注入对超薄栅氧化层击穿的影响，讨论了不同应力条件下的阈值电压变化。